De-embedding Model including Substrate Effects

Substrate 효과를 고려한 De-embedding Model

  • Hwang, Ee-Soon (Department of Semiconductor Science, Dongguk University) ;
  • Lee, Dong-Ik (Department of Semiconductor Science, Dongguk University) ;
  • Jung, Woong (Department of Semiconductor Science, Dongguk University)
  • 황의순 (동국대학교 반도체과학과) ;
  • 이동익 (동국대학교 반도체과학과) ;
  • 정웅 (동국대학교 반도체과학과)
  • Published : 1999.06.01

Abstract

Recently, small signal modeling of CMOS device becomes more difficult because the design rule goes into deep submicron. De-embedding of substrate parameters is important in order to use CMOS devices at RF frequencies. In this paper, we suggest a new de-embedding model with refined physical meaning and accuracy. In GaAs IC’s, the substrate is almost an insulator but Si substrate has the semiconducting characteristics. It offers some troubles if it is treated like GaAs substrate. The conducting substrate is modeled with five resistances, which leads to very accurate modeling so long as the pad layout is symmetrical. Frequency range is up to 39㎓ and fitting accuracy is as small as 0.00037 on least square errors.

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