Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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The Measurement on Diffraction Efficiency in Polarization Holography using Amorphous Chalcogenide Thin Films

칼코게나이드 박막을 이용한 편광 홀로그래픽의 회절효율 측정

  • 장선주 (광운대학교 공대 전자재료공학과) ;
  • 여철호 (광운대학교 공대 전자재료공학과) ;
  • 이현용 (포항공대 Terahertz Photonics연구단) ;
  • 정홍배 (광운대학교 공대 전자재료공학과)
  • Published : 1999.05.01
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Abstract

The dependence of diffraction efficiency as a funct~on of film thickness and incident angle has been investigated in amorphous chalcogenide thin films, which act as a polarization holographic materials. Especially a-(Se, S) based films exhibit a number of photoinduced phenomena not observed in other types of amorphous thin films. Holographic gratings in amorphous As-Ge-Se-S thin films have been formed using the mutual perpendicular polarized(linearly) He-Ne laser light. We could obtain the optimum condition to get high diffraction efficiency.

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