ELECTRICAL EVALUATION OF INTERCONNECTS FOR HIGH SPEED MCM APPLIACTIONS

  • Lee, Y.M. (Micro Systems, Semiconductor Tech. Division, ETRI) ;
  • Park, H.O. (Micro Systems, Semiconductor Tech. Division, ETRI) ;
  • Ju, C.W. (Micro Systems, Semiconductor Tech. Division, ETRI) ;
  • Lee, S.B. (Micro Systems, Semiconductor Tech. Division, ETRI) ;
  • Baek, J.T. (Micro Systems, Semiconductor Tech. Division, ETRI) ;
  • Kim, B.W. (Micro Systems, Semiconductor Tech. Division, ETRI)
  • Published : 1998.08.01