Proceedings of the Materials Research Society of Korea Conference (한국재료학회:학술대회논문집)
- 1998.08a
- /
- Pages.142.4-142
- /
- 1998
SURFACE AND INTERFACIAL BEHAVIOR DURING THE CRYSTALLIZATION OF a-Si:H FILMS DEPOSITED BY DC-SADDLE FIELD CVD; AN IN-SITU SYNCHROTRON X-RAY SCATTERING STUDY
- Kim, H.J. (Department of Materials Science and Engineering. and Center for Electronic Materials Research, Kwangju Institute of Science and Technology) ;
- Jeon, S.H. (Department of Materials Science and Engineering. and Center for Electronic Materials Research, Kwangju Institute of Science and Technology) ;
- Noh, D.Y. (Department of Materials Science and Engineering. and Center for Electronic Materials Research, Kwangju Institute of Science and Technology)
- Published : 1998.08.01
Abstract
Keywords