Novel Testing Method of CMOS Operation Amplifier using Offset Voltage

오프셋 전압을 이용한 CMOS 연산 증폭기의 새로운 테스팅 기법

In this paper, a novel test method is proposed to detect hard and soft fault in CMOS operational amplifiers. Proposed test method mark use of the offset character, which is one of the op-amps characteristics. During the test mode, CUT is implemented to unit gain op-amps with feedback loop. When the input is grounded, a good circuit has a small offset voltage, but a faulty circuit has a large offset voltage exceeding predefined range of tolerance. Using the proposed method, no test vector is required to be applied. Therefore the test vector generation problem is eliminated and the test time is reduced. The accuracy and effectiveness of the method is verified through HSPICE simulation.