Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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A Study on Estimation of Life-time under Semiconducting Layer/Needle Electrode in XLPE

반도전층/침전극하에서 XLPE의 수명시간예측

  • Oh, Ja-Hyung (School of Electrical and Electronic Engineering Wonkwang University) ;
  • Kim, Sung-Tak (School of Electrical and Electronic Engineering Wonkwang University) ;
  • Park, Dae-Hee (School of Electrical and Electronic Engineering Wonkwang University)
  • 오재형 (원광대학교 전기전자공학부) ;
  • 김성탁 (원광대학교 전기전자공학부) ;
  • 박대희 (원광대학교 전기전자공학부)
  • Published : 1998.07.20
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Abstract

In this paper, breakdown strength and time to breakdown are experimented under semiconducting layer/needle electrode in XLPE which is used for power cable insulator. Shape and scale parameters of obtained data are estimated using 2-parameters Weibull distribution. Life-time coefficient(n-value) using shape parameters for breakdown strength and time to breakdown tests is estimated. n-value of 1000 hour aged XLPE showed higher value than that of virgin XLPE. Increase of n-value is estimated by the stability due to removal of by-product and residue gas in XLPE by heating.

Keywords