Fabrication and Dielectric Properties of $(Sr_{1-x}Ca_x)TiO_3$ thin film by RF Magnetron Sputtering Method

RF 마그네트론 스퍼터링법에 의한 $(Sr_{1-x}Ca_x)TiO_3$ 박막의 제조 및 유전특성

  • Published : 1998.07.20

Abstract

The $(Sr_{1-x}Ca_x)TiO_3(SCT)$ thin films were deposited at various substrate temperature using rf magnetron sputtering method on optimized Pt-coated electrodes ($Pt/TiN/SiO_2/Si$). The dielectric constant changes almost linearly in the temperature region of $-80{\sim}+90[^{\circ}C]$, the temperature characteristics of the dielectric loss exhibited a stable value within 0.1. The capacitance characteristics appears a stable value within ${\pm}5$[%]. The drastic decrease of dielectric constant and increase of dielectric loss in SCT thin films is observed above 200[kHz]. Dielectric constant of SCT thin films deposited on Si wafer substrate are larger with the increase of deposition temperature.

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