Proceedings of the Materials Research Society of Korea Conference (한국재료학회:학술대회논문집)
- 1997.10a
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- Pages.35-35
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- 1997
Evaluation of Electromigration Failure Time of Thin-Film Lines by Stress-Induced Defects
응력유도 미세결함에 의한 박막배선의 Electromigration 파손시간 평가
Abstract
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