Carrier recombination dynamics in silicon-dioxide layer on silicon by scanning capacitance microscopy

  • Kang, Chi-Jung (Deppartment of Physics, Seoul National University) ;
  • Kim, Cheol-Kyu (Deppartment of Physics, Seoul National University) ;
  • Young, Kuk (Deppartment of Physics, Seoul National University)
  • 발행 : 1997.07.01