Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 1997.02a
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- Pages.146-146
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- 1997
Surface Chracterization of poly(p-phenylenevinylene) and its derivatives, MEH-PV and DMOS-PPV, using XPS, Static SIMS and ToF-SIMS
- Kim, Seung-Hee (LG Corpporate Institute of Technology) ;
- Kim, T.H. (LG Corpporate Institute of Technology) ;
- Lee, J.W. (LG Corpporate Institute of Technology)
- Published : 1997.02.01
Abstract
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