Development of surface defect inspection algorithms for cold mill strip using tree structure

트리 구조를 이용한 냉연 표면흠 검사 알고리듬 개발에 관한 연구

  • 김경민 (국립여수수산대학교 전기공학과) ;
  • 정우용 (고려대학교 전기전자전파공학부) ;
  • 이병진 (고려대학교 전기전자전파공학부) ;
  • 류경 (고려대학교 전기전자전파공학부) ;
  • 박귀태 (고려대학교 전기전자전파공학부)
  • Published : 1997.10.01

Abstract

In this paper we suggest a development of surface defect inspection algorithms for cold mill strip using tree structure. The defects which exist in a surface of cold mill strip have a scattering or singular distribution. This paper consists of preprocessing, feature extraction and defect classification. By preprocessing, the binarized defect image is achieved. In this procedure, Top-hit transform, adaptive thresholding, thinning and noise rejection are used. Especially, Top-hit transform using local min/max operation diminishes the effect of bad lighting. In feature extraction, geometric, moment, co-occurrence matrix, histogram-ratio features are calculated. The histogram-ratio feature is taken from the gray-level image. For the defect classification, we suggest a tree structure of which nodes are multilayer neural network clasifiers. The proposed algorithm reduced error rate comparing to one stage structure.

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