Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Effects of crystal structure on the dielectric breakdown of polyethylene thin film

PE 박막의 절연파괴특성에 미치는 결정구조의 영향

  • 김종석 (대전산업대학교 전기공학과) ;
  • 신동국 (대전산업대학교 전기공학과) ;
  • 한상옥 (충남대학교 전기공학과) ;
  • 박강식 (충남전문대학 전기과)
  • Published : 1996.05.01
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Abstract

In this paper, We studied polyethylene thin film to evaluate the effects of crystal structure on breakdown properties and the dielectric strength on the condition of impurity free. Bielectric strength of the finn obtained with self healing method that is able to test repeatedly on the same sample is about 3.58 MV/cm at 0.73 $\mu\textrm{m}$. The film shows outstanding crystal domain an\ulcorner crystal structure. The size of spherulites obtained reach 150-200 $\mu\textrm{m}$ in diameter.

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