$CsX^+$ CLUSTER METHOD FOR PHOSPHORUS ppROFILE MEASUREMENT IN THE POLY $Si/SiO_2$ SYSTEM

  • Kim, D.W. (Analysis & Evaluation Technology Team, Semiconductor Business, Samsung Electronics) ;
  • Jung, J.K. (Analysis & Evaluation Technology Team, Semiconductor Business, Samsung Electronics) ;
  • Baek, D.H. (Analysis & Evaluation Technology Team, Semiconductor Business, Samsung Electronics)
  • 발행 : 1996.02.01