Growth and Characterization of Multilayered Pt-Co Alloy Thin Film on Si as a New Typpe of Standard Material for Surface Compositional Analysis

  • Kim, Kyung-Joong (Korea Research Institute of Standards and Science(KRISS)) ;
  • Moon, Dae-Won (Korea Research Institute of Standards and Science(KRISS))
  • 발행 : 1996.02.01