Proceedings of the Korean Vacuum Society Conference (한국진공학회:학술대회논문집)
- 1996.02a
- /
- Pages.160-160
- /
- 1996
Growth and Characterization of Multilayered Pt-Co Alloy Thin Film on Si as a New Typpe of Standard Material for Surface Compositional Analysis
- Kim, Kyung-Joong (Korea Research Institute of Standards and Science(KRISS)) ;
-
Moon, Dae-Won
(Korea Research Institute of Standards and Science(KRISS))
- Published : 1996.02.01
Abstract
Keywords