Charicteristics of HF 10-cm Type Grid Ion Source for Inert and Chemically Reactive Gases.

  • Chol, W.K (Division of Electro-Optic Ceramics, Korea Institute of Science and Technlolgy) ;
  • Koh, S.K (Division of Electro-Optic Ceramics, Korea Institute of Science and Technlolgy) ;
  • Jang, H.G (Division of Electro-Optic Ceramics, Korea Institute of Science and Technlolgy) ;
  • Jung, H.J (Division of Electro-Optic Ceramics, Korea Institute of Science and Technlolgy) ;
  • Kondranin, S.G. (Division of Electro-Optic Ceramics, Korea Institute of Science and Technlolgy) ;
  • Kralkina, E.A. (Division of Electro-Optic Ceramics, Korea Institute of Science and Technlolgy) ;
  • Bougrov, G.E. (Riame Mai)
  • Published : 1996.02.01

Abstract

This paper represents a new type low power High Frequency technological ion source (HF TIS) for ion - beam processing: the surface modification of materials, cleaning of surface, sputtering, coating of thin films, and polishing. The operational principle of HF TIS is based on the excitation of electrostatic waves in plasma located in the external magnetic field. Low power HF TIS with diameter 92 rom gives the opportunity to obtain beams of inert and chemically reactive gases with currents range from 5 to 150 mA (current density $0.015\;~\;3.5\;mA/\textrm{m}^2$) and ion beam energy 100 ~ 2500 eV at a HF power level 10 ~ 150 W. Three grid concave type ion optical system (IOS) is used for extraction and formation ofion beam.n beam.

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