제어로봇시스템학회:학술대회논문집
- 1996.10a
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- Pages.279-282
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- 1996
Fault diagnosis of a logical circuit by use of input grouping method
- Miyata, Chikara (Kagoshima National College of Technology) ;
- Kashiwagi, Hiroshi (Faculty of Engineering, Kumamoto University)
- Published : 1996.10.01
Abstract
The authors have already proposed a method for grouping of inputs of a logical circuit under test (LCUT) by use of M-sequence correlation. We call this method as input grouping (IG) method. In this paper, the authors propose a new method to estimate the faulty part in the circuit by use of IG when some information on the candidate of faulty part can be obtained beforehand. The relationship between IG and fault probabilities of a LCUT, and undetected fault ratios are investigated for various cases. Especially the investigation was made in case where the IG was calculated by use of n correlation functions (I