대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 1996년도 하계학술대회 논문집 C
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- Pages.1725-1727
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- 1996
BAM으로 관측한 PAAS L막의 특성 및 LB막의 광학적, 전기적 특성에 관한 연구
Optical and electrical properties of the PAAS L films and LB films observed by BAM
- Lee, Seung-Yop (School of Electronics & Electrical Engineering, Hong-Ik University) ;
- Kim, Tae-Wan (Department of Physics, Hong-Ik University) ;
- Kang, Dou-Yol (School of Electronics & Electrical Engineering, Hong-Ik University)
- 발행 : 1996.07.22
초록
Brewster angle microscopy(BAM) makes it possible to measure domains of Langmuir films. Especially, formation and phase transition of the PAAS Langmuir monolayers from a gas phase to a solid phase at the air-water interface were observed by the use of BAM. And also we observed the comparative images of films deposited at each phase. The UV/visible absorption spectra of this films showed molecular intensity and aggregation at each state. The electrical properties of this material were measured by current-voltage(I-V) characteristics.
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