대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 1996년도 하계학술대회 논문집 C
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- Pages.1466-1468
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- 1996
$Al_{2}O_{3}$ crystal의 유전손실계수 측정에 관한 연구
A study on dielectric loss tangent measurement with $Al_{2}O_{3}$ crystal
- Lee, Jong-Chan (Wonkwang University) ;
- Lin, Yea-Hoon (Wonkwang University) ;
- Lee, Rae-Duk (Korea Research Institute of Standards and Science) ;
- Park, Dae-Hee (Wonkwang University)
- 발행 : 1996.07.22
초록
The standards of the capacitance arc measured and analyzed by the dry nitrogen or mica film as a dielectric. In this paper, respectively the standard capacitors of 10 pF and 100 pF for the establishment of the dielectric loss tangent are made by
키워드