Measurement of Lattice Parameter of Primary Si Crystal in Stircasting by CBED Method
- Kim, Soo-Chul (Advanced Analysis Center) ;
- Lee, Jung-Ill (Division of Metals / Korea Institute of Science & Technology) ;
- Kim, Gyeung-Ho (Division of Metals / Korea Institute of Science & Technology) ;
- Lee, Ho-In (Division of Metals / Korea Institute of Science & Technology)
- Published : 1995.06.01
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