한국전자현미경학회:학술대회논문집

Korean Society of Microscopy (한국현미경학회)
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Simple Procedure for Phase Identification Using Convergent Beam Electron Diffraction Pattern

  • Kim, G. H. (Division of Metals, Korea Institute of Science and Technology) ;
  • Kim, H. S. (Division of Metals, Korea Institute of Science and Technology) ;
  • Kum, D. W. (Division of Metals, Korea Institute of Science and Technology)
  • Published : 1995.06.01
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