Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)
- 1995.11a
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- Pages.541-543
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- 1995
A study on the threshold current ratio method using the measurement of coated facet reflectivity of a laser diode
레이저 다이오드의 코팅된 단면의 반사율 측정에 사용되는 문턱전류비에 관한 연구
- Lee, Sang-Moo (Soong Sil University) ;
- Kim, Boo-Gyoun (Soong Sil University)
- Published : 1995.11.18
Abstract
We propose the improved threshold current ratio method to determine the reflectivity of coated facets. The carrier recombination time used in the improved threshold current ratio method depends on the value of facet reflectivities. However, the carrier recombination time used in the conventional threshold current ratio method is constant regardless of facet reflectivities. The difference between the results of the two methods increases as the reflectivity of a coated facet decreases.
Keywords