Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지

The Mirror Characteristics of Dielectric Multilayer Optimized at 1.55${\mu}{\textrm}{m}$ Wavelength

1.55${\mu}{\textrm}{m}$에서 최적화된 유전체 다층막의 미러 특성

  • 박태성 (광운대학교 전자재료공학과) ;
  • 정홍배 (광운대학교 전자재료공학과) ;
  • 김명진 (전자부품종합기술연구소) ;
  • 윤대원 (전자부품종합기술연구소)
  • Published : 1995.11.01
Download PDF
⟨ Previous Next ⟩

Abstract

The fabrication of dielectric multilayer mirror(DMM) optimized at the wavelength of 1.55$\mu\textrm{m}$ and its spectral properties were investigated. The materials used in the fabrication of DMM are TiO$_2$-SiO$_2$, which have the advantage of yielding high reflectance for relatively small numbers of layers. The optical constants of TiO$_2$single film were obtained by using a modified envelope method. The reflectances of DMMs with 3,7,11 and 23 layers were 58%, 89%, 97% and 99.9% at the wavelength of 1.55$\mu\textrm{m}$, respectively.

Keywords