Growth and Characterization of $Ta_2O_5$ Thin Films on Si by Ion Beam Sputter Deposition

  • Park, K.S. (Dep. of Mat. Sci. & Eng. Korea University) ;
  • Lee, D.Y. (Dep. of Mat. Sci. & Eng. Korea University) ;
  • Kim, K.J. (Surface Analysis Group, Korea Res. Inst. of Standards and Science) ;
  • Moon, D.W. (Surface Analysis Group, Korea Res. Inst. of Standards and Science)
  • Published : 1995.06.01