한국정밀공학회:학술대회논문집 (Proceedings of the Korean Society of Precision Engineering Conference)
- 한국정밀공학회 1995년도 추계학술대회 논문집
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- Pages.255-258
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- 1995
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- 2005-8446(pISSN)
CCD를 이용한 인프로세스 표면형상의 계측
In-process Measurement of Surface Profile using CCD
초록
Surface profile is an important paramerer to evaluate accuracy of machined worpiece. It is necessary to acquire this data by in-process measurement. Recent researchers have introduced Machine Vision technique to achieve it. But it is difficult to apply it to industry field yet. In this study, in-process measuring system of surface profile is developed using CCD camera. The effect of illuminance according to incident angle is investigated and surface profile from surface tester and illuminance graph are compared experimentally.