대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)

대한전기학회 (The Korean Institute of Electrical Engineers)
권호 표지

간이 합성시험설비의 구성 및 회로특성

Construction and Circuital Characteristics of Simple Synthetic Test Facility

  • 이정희 (한국전기연구소 개폐장치연구팀) ;
  • 박경엽 (한국전기연구소 개폐장치연구팀) ;
  • 장기찬 (한국전기연구소 개폐장치연구팀) ;
  • 신영준 (한국전기연구소 개폐장치연구팀)
  • Lee, J.H. (Korea Electrotechnology Research Institute) ;
  • Park, K.Y. (Korea Electrotechnology Research Institute) ;
  • Chang, K.C. (Korea Electrotechnology Research Institute) ;
  • Shin, Y.J. (Korea Electrotechnology Research Institute)
  • 발행 : 1995.07.20
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초록

This paper proposes the circuit of the simple synthetic testing facility using LC resonance circuit. The analyzed results of the circuit which can be useful for the design stage of the testing facility are also shown. EMTP has been used to analyze the circuit. Two cases of short-circuit test results obtained from the simple synthetic testing facility in KERI are shown with the waveforms of current and voltage. The results also indicate that the simple synthetic testing facility using LC resonance circuit can be easily designed and used very usefully for the research and development for the switchgears.

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