대한전기학회:학술대회논문집 (Proceedings of the KIEE Conference)
- 대한전기학회 1993년도 하계학술대회 논문집 B
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- Pages.1256-1258
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- 1993
광기록을 위한 Te-based Antireflection구조의 열적, 광학적 특성
The Thermal and Optical Properties of Te-based Antireflection structure for Optical Recording
- Lee, S.J. (Dept. of Electronic materials Eng. Kwangwoon Univ.) ;
- Lee, H.Y. (Dept. of Electronic materials Eng. Kwangwoon Univ.) ;
- Chung, H.J. (Dept. of Electronic materials Eng. Kwangwoon Univ.) ;
- Lee, Y.J. (Dept. of Electronic Eng. Yeojoo Technical College)
- 발행 : 1993.07.18
초록
Optical data storage offer high density storage and archival storage capability. In this study, we selected the ablation mechanism-one of an irreversible recording system-using the antireflection trilayer(ART) structure. Optical recording medium is a
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