Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 1992.11a
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- Pages.73-76
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- 1992
A study on amorphous-amorphous phase transition of As-Se-S-Ge thin films
As-Se-S-Ge계 박막의 비정질-비정질 상변환 연구
- Lee, S.J. (Dept. of Electronics materials Eng. Kwangwoon Univ.) ;
- Lee, Y.J. (Dept. of Electronics materials Eng. Kwangwoon Univ.) ;
- Chang, H.B. (Dept. of Electronics materials Eng. Kwangwoon Univ.) ;
- Kim, J.B. (Dept. of Electronics Eng. Chosun Univ.)
- Published : 1992.11.07
Abstract
The amorphous phase of bulk and thin film in the As-Se-S-Ge system was observed by X-ray diffraction. Thermal analysis using DSC, DTA and TGA method has been used for the determination of the glass transition temperature, Tg. The glass transition temperature, Tg for the composition were
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