Proceedings of the Materials Research Society of Korea Conference (한국재료학회:학술대회논문집)
- 1992.05b
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- Pages.76-77
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- 1992
Nondestructive Characterization of GaAs/$Al_{x}Ga_{1-x}$ As/GaAs HMESFET Heterostructures by Spectroscopic Ellipsometry
분광식 일립소메타를 이용한 GaAs/Al(x)Ga(1-x)As/GaAs이종구조의 비파괴적인 측정
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