한국전기전자재료학회:학술대회논문집 (Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference)
- 한국전기전자재료학회 1992년도 춘계학술대회 논문집
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- Pages.82-85
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- 1992
Charge Pumping 방법을 이용한 비휘발성 SNOS FET기억소자의 Si-SiO$_2$ 계면상태 특성에 관한 연구
A Study on the Si-SiO$_2$ Interface State Characteristics of Nonvolatile SNOS FET Memories using The Charge Pumping Method
초록
In this study, charge pumping method was used to investigate the Si-SiO
키워드