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Filed Programmable Logic Control and Test Pattern Generation for IoT Multiple Object switch Control

사물인터넷 환경에서 다중 객체 스위치 제어를 위한 프로그래밍 가능한 로직제어 및 테스트 패턴 형성

  • Kim, Eung-Ju (Dept. of Semiconductor Design, Semiconductor Convergence Campus of Korea Polytechnics) ;
  • Jung, Ji-Hak (Dept. of Semiconductor & Display, Asan Campus of Korea Polytechnics)
  • 김응주 (한국폴리텍대학 반도체융합캠퍼스 반도체설계과) ;
  • 정지학 (한국폴리텍대학 아산캠퍼스 반도체디스플레이과)
  • Received : 2019.12.21
  • Accepted : 2020.01.29
  • Published : 2020.03.31

Abstract

Multi-Channel Switch ICs for IoT have integrated several solid state structure low ON-resistance bi-directional relay MOS switches with level shifter to drive high voltage and they should be independently controlled by external serialized logic control. These devices are designed for using in applications requiring high-voltage switching control by low-voltage control signals, such as medical ultra-sound imaging, ink-jet printer control, bare board open/short and leakage test system using Kelvin 4-terminal measurement method. This paper describes implementation of analog switch control block and its verification using Field programmable Gate Array (FPGA) test pattern generation. Each block has been implemented using Verilog hardware description language then simulated by Modelsim and prototyped in a FPGA board. Compare to conventional IC, The proposed architecture can be applied to fields where multiple entities need to be controlled simultaneously in the IoT environment and the proposed pattern generation method can be applied to test similar types of ICs.

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