The method of development for enhancing reliability of missile assembly test set

유도탄 점검 장비의 신뢰성 향상을 위한 개발 방법

  • Koh, Sang-Hoon (PGM Research and Development Lab, LIGNex1 Co., Ltd.) ;
  • Han, Seok-Choo (The 1st Research and Development Institute, Agency for Defense Development) ;
  • Lee, Kye-Shin (PGM Research and Development Lab, LIGNex1 Co., Ltd.) ;
  • Lee, You-Sang (PGM Research and Development Lab, LIGNex1 Co., Ltd.) ;
  • Kim, Young-Kuk (PGM Research and Development Lab, LIGNex1 Co., Ltd.) ;
  • Park, Dong-Hyun (The 1st Research and Development Institute, Agency for Defense Development)
  • 고상훈 (LIG넥스원(주) 유도무기1연구소) ;
  • 한석주 (국방과학연구소 제1기술연구본부) ;
  • 이계신 (LIG넥스원(주) 유도무기1연구소) ;
  • 이유상 (LIG넥스원(주) 유도무기1연구소) ;
  • 김용국 (LIG넥스원(주) 유도무기1연구소) ;
  • 박동현 (국방과학연구소 제1기술연구본부)
  • Received : 2018.05.09
  • Accepted : 2018.08.03
  • Published : 2018.08.31


A developer solves problems with isolating failures if faults are detected when inspecting missiles using the missile assembly test set (MATS) and then resumes the testing. In order to identify faults, it is necessary to analyze the data coming from the equipment, but the information received may not be sufficient, depending on the inspection environment. In this case, the developer repeats the test until the problem is reproduced or checks the performance of each piece of equipment that is related to the fault. When this task is added, schedule management becomes problematic, and development costs rise. To solve this problem, we need to design a MATS in a systematic way to increase fault coverage while satisfying the required reliability. By designing the necessary processes for each procedure, it is possible to reduce the fault identification time when a fault is detected during operations. But it is not possible to guarantee 100% fault coverage, so we provide another method by comparing costs and effects. This paper describes a development method to enhance the reliability of the missile assembly test set; it describes the expected effects when it is adapted, and describes the limitations of this method.


MATS(Missile Assembly Test Set);Fault Detection;Failure Isolation;Fault coverage;BIT(Built In Test)


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