Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)
- Volume 30 Issue 3
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- Pages.148-151
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- 2017
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- 1226-7945(pISSN)
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- 2288-3258(eISSN)
DOI QR Code
The Optimal Design of Field Ring for Reliability and Realization of 3.3 kV Power Devices
3.3 kV 이상의 전력반도체 소자 구현 및 신뢰성 향상을 위한 필드링 최적 설계에 관한 연구
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Kang, Ey Goo
(Department of Photovoltaic Engineering, Far East University)
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강이구
(극동대학교 태양광공학과)
- Received : 2017.01.12
- Accepted : 2017.02.09
- Published : 2017.03.01
Abstract
This research concerns field rings for 3.3kV planar gate power insulated-gate bipolar transistors (IGBTs). We design an optimal field ring for a 3.3kV power IGBT and analyze its electrical characteristics according to field ring parameters. Based on this background, we obtained 3.3kV high breakdown voltage and a 2.9V on state voltage drop. To obtain high breakdown voltage, we confirmed that the field ring count was 23, and we obtained optimal parameters. The gap distance between field rings
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