Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)
- Volume 30 Issue 1
- /
- Pages.59-62
- /
- 2017
- /
- 1226-7945(pISSN)
- /
- 2288-3258(eISSN)
DOI QR Code
Electrical Properties of Yarned Carbon Nanotube Fiber Resistors
Yarned CNT Fiber 저항체의 전기적 특성
-
Lim, Youngtaek
(School of Electrical Engineering, Inha University) ;
- Lee, Sunwoo (Department of Electrical Information, Inha Technical College)
- Received : 2016.11.14
- Accepted : 2016.12.01
- Published : 2017.01.01
Abstract
CNT (carbon nanotube) resistors with low resistance and negative TCR (temperature coefficient of resistance) were fabricated with yarned CNT (carbon nanotube) fibers. The CNT fibers were prepared by yarning CNTs grown on the silicone substrate by CVD (chemical vapor deposition) method. The CNT resistors were fabricated by winding CNT fibers on the surface of ceramic rod. Both metal terminals were connected with the CNT fiber wound on the ceramic rod. We measured electrical resistance and thermal stability with the number of CNT fibers wound. The CNT resistor system shows linearly decreased resistance with the number of CNTs wound on the ceramic rod and saturated at 20 strands. The CNT resistor system has negative TCR between
File
References
- F. Galliana, P. P. Capra, and E. Gasparotto, Journal of measurement, 46, 1630 (2013). [DOI: http://dx.doi.org/10.1016/j.measurement.2012.11.031] https://doi.org/10.1016/j.measurement.2012.11.031
- F. Zandman, P. R. Simon, and J. Szwarc, Resistor theory and technology, 1st ed. (Vishy Inter technology Inc, Malvern, 2001) p. 76.
- J. Hu, T. W. Odom, and C. M. Lieber, Acc. Chem. Res., 32, 435 (1999). https://doi.org/10.1021/ar9700365
- P. G. Collins, A. Zettl, H. Bando, A. Thess, and R. E. Smalley, Science, 278, 100 (1997). [DOI: https://doi.org/10.1126/science.278.5335.100] https://doi.org/10.1126/science.278.5335.100
- P. L. McEuen, M. S. Fuhrer, and H. Park, IEEE Trans. Nanotech., 1, 78 (2002). [DOI: https://doi.org/10.1109/TNANO.2002.1005429] https://doi.org/10.1109/TNANO.2002.1005429
- E. Flahaut, R. Bacsa, A. Peigney, and C. Laurent, Chemical Communications, 12, 1442 (2003). [DOI: https://doi.org/10.1039/b301514a]
- J. W. Mintmire, B. I. Dunlap, and C. T. White, Phys. Rev. Lett., 68, 631 (1992). [DOI: https://doi.org/10.1103/PhysRevLett.68.631] https://doi.org/10.1103/PhysRevLett.68.631
- C. Dekker, Physics Today, 52, 22 (1999). [DOI: https://doi.org/10.1063/1.882658]
- O. Meincke, D. Kaempfer, H. Weickmann, C. Friedrich, M. Vathauer, and H. Warth, Polymer, 45, 739 (2004). [DOI: https://doi.org/10.1016/j.polymer.2003.12.013] https://doi.org/10.1016/j.polymer.2003.12.013
- A. Thess, R. Lee, P. Nikolaev, H. Dai, P. Petit, J. Robert, C. Xu, Y. H. Lee, S. G. Kim, A. G. Rinzler, D. T. Colbert, G. E. Scuseria, D. Tomanek, J. E. Fischer, and R. E. Smalley, Science, 273, 483 (1996). [DOI: https://doi.org/10.1126/science.273.5274.483] https://doi.org/10.1126/science.273.5274.483
- A. Thess, R. Lee, P. Nikolaev, H. Dai, P. Petit, J. Robert, C. Xu, Y. H. Lee, S. G. Kim, A. G. Rinzler, D. T. Colbert, G. E. Scuseria, D. Tomanek, J. E. Fischer, and R. E. Smalley, Phys. Rev. Lett., 87, 256805-1 (2001). [DOI: https://doi.org/10.1103/PhysRevLett.87.256805] https://doi.org/10.1103/PhysRevLett.87.256805
- W. Lowrie, Fundamentals of Geophysics: (Cambridge University Press, Zurich, 2007) p. 254.
- B.N.J. Persson and N. D. Lang, Phys. Rev. B, 26, 5409 (1982). https://doi.org/10.1103/PhysRevB.26.5409
- H. Gerischer, J. Phys. Chem., 88, 6096 (1984). https://doi.org/10.1021/j150669a007
- W. Choi, A. Termin, and M. R. Hoffmann, J. Phys. Chem., 98, 13669 (1994). https://doi.org/10.1021/j100102a038
- M. Zhang, K. R. Atkinson, and R. H. Baughman, Science, 306, 1358 (2004). [DOI: https://doi.org/10.1126/science.1104276] https://doi.org/10.1126/science.1104276