Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)
- Volume 29 Issue 7
- /
- Pages.404-407
- /
- 2016
- /
- 1226-7945(pISSN)
- /
- 2288-3258(eISSN)
DOI QR Code
Microstructure and Dielectric Properties of Low Temperature Sintering (Ba0.86Ca0.14)(Ti0.85Zr0.12Sn0.03)O3 System Ceramics
저온소결 (Ba0.86Ca0.14)(Ti0.85Zr0.12Sn0.03)O3계 세라믹스의 미세구조와 유전 특성
-
Yoo, Ju-Hyun
(Department of Electrical Engineering, Semyung University)
-
류주현
(세명대학교 전기공학과)
- Received : 2016.04.16
- Accepted : 2016.05.09
- Published : 2016.07.01
Abstract
In this study, to develop low temperature sintering capacitor composition ceramics with the good dielectric properties,
File
References
- S. H. Shin, J. D. Han, and J. H. Yoo, Mater. Lett., 154, 120 (2015). [DOI: http://dx.doi.org/10.1016/j.matlet.2015.03.121] https://doi.org/10.1016/j.matlet.2015.03.121
- S. H. Shin, J. H. Yoo, and S. D. Lee, Ferroelectr. Lett. Section, 41, 1 (2014). [DOI: http://dx.doi.org/10.1080/07315171.2014.908678] https://doi.org/10.1080/07315171.2014.908678
- S. M. Rhim, S. M. Hong, H. J. Bak, and O. K. Kim, J. Korean Ceram. Soc., Lett., 36, 767 (1999).
- D. K. Yim, J. R. Kim, D. W. Kim, K. S. Hong, J. Eur. Ceram. Soc. Lett., 27, 3053 (2007). [DOI: http://dx.doi.org/10.1016/j.jeurceramsoc.2006.11.029] https://doi.org/10.1016/j.jeurceramsoc.2006.11.029
- J. G. Fisher, D. G. Lee, H. H. Oh, H. N. Kim, D. Nguyen, J. H. Kim, J. S. Lee and H. Y. Lee, J. Korean Ceram. Soc. Lett., 50, 157 (2013). https://doi.org/10.4191/kcers.2013.50.2.157
- Q. Zeng, W. Li, J. L. Shi, J. K. Guo, H. Chen, M. L. Liu, J. Eur. Ceram. Soc.. Lett., 27, 261 (2007). [DOI: http://dx.doi.org/10.1016/j.jeurceramsoc.2006.04.174] https://doi.org/10.1016/j.jeurceramsoc.2006.04.174
- B. J. Kim, M. H. Kim, S. Nahm, H. T. Kim, J. H. Kim, J. H. Paik, H. Ryu, H. J. Lee, J. Eur. Ceram. Soc.. Lett., 27, 1065 (2007). [DOI: http://dx.doi.org/10.1016/j.jeurceramsoc.2006.05.060] https://doi.org/10.1016/j.jeurceramsoc.2006.05.060
- S. H. Shin, J. H. Yoo, and D. C. Shin, Korean Inst. Electr. Electron. Mater. Eng., 27, 797 (2014).
- G. M. Lee, J. H. Yoo, and J. Y. Lee, J. Korean Inst. Electr. Electron. Mater. Eng., 28, 690 (2015).