Electric Properties of Thermal Conductive Silicone Rubber due to Thermally Degradation

열 열화한 열전도성 실리콘 고무의 전기특성

  • Lee, Sung Ill (Department of safety Engineering, Korea National University of Transportation)
  • 이성일 (한국교통대학교 안전공학과)
  • Received : 2016.10.30
  • Accepted : 2016.11.15
  • Published : 2016.12.01


In this study, the electrostatic capacity and dielectric loss tangent for $20{\mu}m$ thick thermal conductivity silicone rubber which is heated at 80 degrees for 8 hours has been measured at temperature of $30^{\circ}C{\sim}170^{\circ}C$, frequency of 0.1~1 MHz. The results of degradation evaluation by this study are as follows. In low frequency, it found that the electrostatic capacity decreased with increasing temperature. On the other hand, it confirmed that the range of the electrostatic capacity narrowed with increasing frequency. It confirmed that there are the carboxylic acid structure and C-O bonding at range of wave number 1,000cm-1 to 1,300cm-1.


Supported by : 한국교통대학교


  1. W. Noll, Chemistry and Technology of silicones, 496 (1968).
  2. W. H. Hayt Jr., Engineering Electromagnetics (McGraw-Hill Book Company, New York, 1989).
  3. Y. S. Yoo, J. H. Kim, K. S. Seo, H. G. Cho, and Y. K. Park J. Korean Inst. Electr. Electron. Mater. Eng., 12, 1052 (1999).
  4. S. Lee, J. Korean Inst. Electr. Electron. Mater. Eng., 27, 841 (2014). [DOI:]
  5. W. Lynch, Handbook of Silicone Rubber Fabrication (Litton Educational Publishing. Inc., USA, 1987).
  6. L. J. Bellamy, The Infrared Spectra of Complex Molecules (John Wiley & Sons, New York, 1966).
  7. J. H. Mason, Proc. the IEE-Part I: General, 98 (1951) p. 44.
  8. Annual Book of ASTM Standards, 10.01, 19 (Electrical Insulation, 1993).
  9. P. Paul and C. N. Reddy, IEE Trans on Elect. Insol., EI-15, 43 (1980).
  10. Lee Sungill, Ph. D. A study on the Properties of Dielectric and Thermally Stimulated Current of Silicone Rubbers Added Reinforcing Fillers, Kwangwoon University, Seoul (1994).
  11. A.R.V. Hippel, Dielectric Materials And Applications (The Massachusetts Institute of Technology, USA, 1954).