The introduction of X-ray spectroscopy for surface and interface electronic structures

X선을 이용한 표면 및 계면의 전자구조 측정방법 소개

  • Published : 2014.03.30


This article introduces the basic concepts of various soft X-ray spectroscopies in the study of surface and interface electronic structures. Especially, recent results of X-ray photoelectron spectroscopy experiments on organic/inorganic thin films and a lead-free solder alloys will be discussed. Soft X-ray spectroscopies to understand the chemical and electrical properties would be of broad interest in the vacuum science communities.



  1. Advanced Light Source,
  2. Stefan H.fner, Photoelectron Spectroscopy Principles and Applications, Springer-Verlag (1995).
  3. Joachim, Nexafs Spectroscopy, Springer (2003).
  4. L.F.J. Piper, S.W. Cho, Y. Zhang, A. DeMasi, K.E. Smith, A.Y. Matsuura, and C. McGuinness, Phys. Rev. B 81, 045210 (2010).
  5. L.F.J. Piper, A.R.H. Preston, A. Fedorov, S.W. Cho, A. DeMasi, and K.E. Smith, Phys, Rev. B 81, 233305 (2010).
  6. Hyunbok Lee, Sang Wan Cho, Jeihyun Lee, Pyung Eun Jeon, Kwangho Jeong, Jin Woo Lee, and Yeonjin Yi, J. Appl. Phys 111, 043712 (2012).