Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

Evaluation on the Properties of the Current Transporting Part for Fault-Current-Limiting Type HTS Cables

사고전류 제한형 고온 초전도케이블의 통전부 특성평가

  • Kim, Tae-Min (Department of Electricity Engineering, Chonbuk National University) ;
  • Hong, Gong-Hyun (Department of Electricity Engineering, Chonbuk National University) ;
  • Han, Byung-Sung (Department of Electricity Engineering, Chonbuk National University) ;
  • Du, Ho-Ik (Hope IT Human Resource Development Center, Chonbuk National University)
  • 김태민 (전북대학교 전기공학과) ;
  • 홍공현 (전북대학교 전기공학과) ;
  • 한병성 (전북대학교 전기공학과) ;
  • 두호익 (전북대학교 HOPE IT 인력양성사업단)
  • Received : 2014.09.18
  • Accepted : 2014.09.24
  • Published : 2014.10.01

Abstract

When an abnormal condition occurs due to a fault current at a consumer location where electricity is supplied through high-Tc superconducting(HTS) cable, the HTS cable would be damaged if there is no appropriate method to protect it. The fault-current-limiting type HTS cable that is suggested in this study has a structure of transport part and limit part. It conduct a zero impedance transport current at ordinary operations and carry out a fault current limiting at extraordinary operations. To make a perfect this structure, it is essential to investigate electrical properties of transport part that comprise the fault-current-limiting type HTS cable. In this paper, transport part that comprise HTS wire with copper stabilization layer is examined the current transport properties and the stability evaluation.

Keywords

File

Download PDF

Acknowledgement

Supported by : 한국전력공사

References

  1. S. H. Lee and J. U. Park, World of Electricity Journal, 63, 28 (2014).
  2. J. H. Kim and K. W. Lee, Electrical Journal, 257, 19 (1998).
  3. O. B. Hyun, The proceedings of KIEE, SFCL Development and Application, 59, 26 (2010).
  4. D. Hazelton, Y. Xie, V. Selvamanickam, R. Anthony, J. C. Llambes, and T. Lehner, IEEE Citres, 10, 42 (2010).
  5. M. J. Kim, H. I. Du, S. G. Du, Y. J. Kim, D. H. Lee, and B. S. Han, J. KIEEME, 22, 1067 (2009).
  6. A. Ishiyama, H. Ueda, T. Ando, H. Naka, S. Bamba, and Y. Shiohara, IEEE Trans. Appl. Supercond., 17, 2430 (2007). https://doi.org/10.1109/TASC.2007.897998
  7. S. O. Heo, T. M. Kim, B. S. Han, and H. I. Du, J. KIEEME, 26, 904 (2013).