- Volume 27 Issue 1
DOI QR Code
Electrical and Optical Properties of OLEDs Depending on the Layer Change of HIL Teflon-AF and EIL Li2CO3
정공주입층재료 Teflon-AF와 전자주입층재료 Li2CO3의 층수 변화에 따른 유기발광다이오드의 전기·광학적 특성
- Kwang, Yong-Gil (Department of Electrical Engineering, Kwangwoon University) ;
- Hong, Jin-Woong (Department of Electrical Engineering, Kwangwoon University)
- Received : 2013.11.04
- Accepted : 2013.11.28
- Published : 2014.01.01
It was firstly found in 1st group element. Recently, it has been reported on the improvement of efficiency of the OLEDs by introducing thin layer of some carbonate materials of alkali metal. In order to improve the efficiency of OLEDs which is one of the next generation displays, we have studied the electrical characteristics of the device depending on the thickness ratio of the hole-injection layer to the electron-injection layer. Teflon-AF was used as the hole-injection material, and alkali-metal carbonates of
- C. W. Tang and S. A. VanSlyke, Appl. Phys. Lett., 51, 913 (1987). https://doi.org/10.1063/1.98799
- D. H. Chung, S. K. Kim, J. W. Hong, J. U. Lee, and T. W. Kim, J. KIEEME, 16, 409 (2003).
- P. C. Kao, J. H. Lin, J. Y. Wang, C. H. Yang, and S. H. Chen, Appl. Phys. Lett., 109, 094505 (2011).
- J. H. Z. Xu and Y. Yang, Advanced Functional Materials, 17, 1966 (2003).
- H. Arakawa and K. Sayama, Catalysis Surveys from Japan, 4, 75 (2000). https://doi.org/10.1023/A:1019096323694
- J. W. Park, J. T. Lim, J. S. Oh, S. H. Kim, P. P. Viet, M. S. Jhon, and G. Y. Yeom. Journal of Vacuum Science & Technology, A31, 031101 (2013).
- V. Savvate’ev, J. Friedl, and L. Zou, Appl. Phys. Lett., 76, 2170 (2000). https://doi.org/10.1063/1.126287
- F. Ebisawa, T. Kurokawa, and S. Nara, Appl. Phys. Lett., 54, 3255 (1983).
- S. R. Forrest, Nature, 428, 911 (2004). https://doi.org/10.1038/nature02498
- J. W. Hong, D. H. Oh, C. H. Kim, G. Y. Kim, and T. W. Kim, Journal of Ceramic Processing Research, 13, 193 (2010).
- J. W. Hong, C. H. Kim, H. S. Han, Y. G. Kang, J. Y. Lee, and T. W. Kim. Appl. Phys. Lett., 60, 1611 (2012).
- S. M. Shim, H. S. Han, Y. G. Kang, W. J. Kim, and J. W. Hong, J. KIEEME, 24, 750 (2011).