A Comparison of the Failure Mechanism for High Power Converted White LEDs(3W)

고 출력 백색 변환용 LED(3W용)의 고장메커니즘 비교

  • Yun, Yang-Gi (Reliability Assessment Team, Korea Testing Certification) ;
  • Jang, Jung-Sun (Department of Industrial Engineering, Graduate School of Ajou University)
  • 윤양기 (한국기계전기전자시험연구원) ;
  • 장중순 (아주대학교 산업정보시스템공학부)
  • Received : 2012.07.18
  • Accepted : 2012.09.15
  • Published : 2012.09.25

Abstract

This paper presents a comparison of the failure mechanism for high power converted white LEDs(3W) with the commercially available YAG:Ce and silicate phosphor. We carry out the normal aging life test for 10,000 hours, the high temperature aging test for 8,000 hours, the high temperature and humidity aging test for 8,000 hours and the current aging testing for 5,000 hours. The optical and electrical parameters of LEDs were monitored, such as lumen, correlated color temperature (CCT), chromaticity coordinates(x, y), thermal resistance, I -V curve and spectrum intensity. The stress induced a luminous flux decay on LED in all experiments and causes a failure. So we try to find out what's a main failure mechanism for a high power LED.

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