미세변동공정관리를 위한 가속수명시험관리도 설계

• Accepted : 2012.09.12
• Published : 2012.09.30

Abstract

In the manufacturing process the most widely used $\bar{X}$ chart has been applied to control the process mean. Also, Accelerated Life Test(ALT) is commonly used for efficient assurance of product life in development phases, which can be applied in production reliability acceptance test. When life data has lognormal distribution, through censored ALT design so that censored ALT data has asymptotic normal distribution, $ALT\bar{X}$ control chart integrating $\bar{X}$ chart and ALT procedure could be applied to control the mean of process in the manufacturing process. In the situation that process variation is controlled, $Z_p$ control chart is an effective method for the very small fraction nonconforming of quality characteristic. A simultaneous control scheme with $ALT\bar{X}$ control chart and $Z_p$ control chart is designed for the very small fraction nonconforming of product lifetime.

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