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Dielectric Properties and Phase Transformation of Poled <001>-Oriented Pb(Mg1/3Nb2/3)O3-PbTiO3 Single Crystals

분극된 <001> 방위 Pb(Mg1/3Nb2/3)O3-PbTiO3 단결정의 유전 특성 및 상전이

  • Received : 2012.06.06
  • Accepted : 2012.06.20
  • Published : 2012.07.27

Abstract

The dielectric properties and phase transformation of poled <001>-oriented $Pb(Mg_{1/3}Nb_{2/3})O_3-x%PbTiO_3$(PMN-x%PT) single crystals with compositions of x = 20, 30, and 35 mole% are investigated for orientations both parallel and perpendicular to the [001] poling direction. An electric-field-induced monoclinic phase was observed for the initial poled PMN-30PT and PMN-35PT samples by means of high-resolution synchrotron x-ray diffraction. The monoclinic phase appears from $-25^{\circ}C$ to $100^{\circ}C$ and from $-25^{\circ}C$ to $80^{\circ}C$ for the PMN-30PT and PMN-35PT samples, respectively. The dielectric constant (${\varepsilon}$)-temperature (T) characteristics above the Curie temperature were found to be described by the equation$(1/{\varepsilon}-1/{\varepsilon}_m)^{1/n}=(T-T_m)/C$, where ${\varepsilon}_m$ is the maximum dielectric constant and $T_m$ is the temperature giving ${\varepsilon}_m$, and n and C are constants that change with the composition. The value of n was found to be 1.82 and 1.38 for 20PT and 35PT, respectively. The results of mesh scans and the temperature-dependence of the dielectric constant demonstrate that the initial monoclinic phase changes to a single domain tetragonal phase and a to paraelectric cubic phase. In the ferroelectric tetragonal phase with a single domain state, the dielectric constant measured perpendicular to the poling direction was dramatically higher than that measured in the parallel direction. A large dielectric constant implies easier polarization rotation away from the polar axis. This enhancement is believed to be related to dielectric softening close to the morphotropic phase boundary.

Keywords

ferroelectric;dielectric;relaxor;domain

References

  1. S. E. Park and T. R. Shrout, J. Appl. Phys., 82(4), 1804 (1997). https://doi.org/10.1063/1.365983
  2. S. E. Park and T. R. Shrout, IEEE Trans. Ultrason. Ferroelectrics Freq. Contr., 44(5), 1140 (1997). https://doi.org/10.1109/58.655639
  3. B. Noheda, D. E. Cox, G. Shirane, R. Guo, B. Jones and L. E. Cross, Phys. Rev. B Condens. Matter., 63(1), 014103 (2000). https://doi.org/10.1103/PhysRevB.63.014103
  4. A. K. Singh and D. Pandey, Phys. Rev. B Condens. Matter., 67(6), 064102 (2003). https://doi.org/10.1103/PhysRevB.67.064102
  5. F. Li, S. Zhang, Z. Xu, X. Wei, J. Luo, and T. R. Shrout, J. Appl. Phys., 108(3), 034106 (2010). https://doi.org/10.1063/1.3466978
  6. D. Vanderbilt and M. H. Cohen, Phys. Rev. B Condens. Matter., 63(9), 094108 (2001). https://doi.org/10.1103/PhysRevB.63.094108
  7. A. K. Singh and D. Pandey, Ferroelectrics, 326(1), 91 (2005). https://doi.org/10.1080/00150190500318370
  8. Z. -G. Ye, B. Noheda, M. Dong, D. Cox and G. Shirane, Phys. Rev. B Condens. Matter., 64(18), 184114 (2001). https://doi.org/10.1103/PhysRevB.64.184114
  9. B. Noheda, D. E. Cox, G. Shirane, J. Gao and Z. -G. Ye, Phys. Rev. B Condens. Matter., 66(5), 054104 (2002). https://doi.org/10.1103/PhysRevB.66.054104
  10. Y. Lu, D. -Y. Jeong, Z. -Y. Cheng, Q. M. Zhang, H. -S. Luo, Z. -W. Yin, and D. Viehland, Appl. Phys. Lett., 78(20), 3109 (2001). https://doi.org/10.1063/1.1372360
  11. N. Novak, G. Cordoyiannis, Z. Kutnjak, Ferroelectrics, 428(1), 43 (2012) https://doi.org/10.1080/00150193.2012.675268
  12. E. -G. Lee and J. Lee, Kor. J. Mater. Res., 21(7), 391 (2011) (in Korean). https://doi.org/10.3740/MRSK.2011.21.7.391
  13. M. Kuwabara, S. Takahashi, K. Goda, K. Oshima and K. Watanabe, Jpn. J. Appl. Phys., 31, 3241 (1992) https://doi.org/10.1143/JJAP.31.3241
  14. Z. Feng, X. Zhao and H. Luo, J. Phys. Condens. Matter., 16, 6771 (2004). https://doi.org/10.1088/0953-8984/16/37/013
  15. D. Viehland and J. F. Li, J. Appl. Phys., 92(12), 7690 (2002). https://doi.org/10.1063/1.1524016
  16. M. Budimir, D. Damjanovic, N. Setter, Appl. Phys. Lett., 85(14), 2890 (2004). https://doi.org/10.1063/1.1799231