• Noh, Hyung-Ah (Chungnam National University, Physics Department) ;
  • Cho, Hyuck (Chungnam National University, Physics Department)
  • Received : 2011.11.01
  • Accepted : 2011.12.29
  • Published : 2011.12.30


After the first report that electrons with sub-ionization energy of DNA could cause single strand breaks or double strand breaks to DNA, there have been various studies to investigate the mechanisms of DNA damage by low-energy electrons. In this paper, we examined the possibility of using X-ray photoelectron spectroscopy (XPS) to analyze the dissociation patterns of the molecular bonds by electron irradiation on DNA thin films and tried to establish the method as a general tool for studying the radiation damage of biomolecules by low energ yelectrons. For the experiment, pBR322 plasmid DNA solution was formed into the films on tantalum plates by lyophilization and was irradiated by 5-eV electrons. Un-irradiated and irradiated DNA films were compared and analyzed using the XPS technique.


Supported by : Chungnam National University


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