Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)
- Volume 23 Issue 7
- /
- Pages.566-570
- /
- 2010
- /
- 1226-7945(pISSN)
- /
- 2288-3258(eISSN)
DOI QR Code
The Electro-Optic Properties of Ferroelectric P(VDF-TrFE) LB Films
강유전성 고분자 P(VDF-TrFE) LB박막의 전기광학 특성
- Kwak, Eun-Hwi (Laser and Optical Information Engineering, Cheongju University) ;
- Jung, Chi-Sup (Laser and Optical Information Engineering, Cheongju University)
- Received : 2010.04.30
- Accepted : 2010.06.21
- Published : 2010.07.01
Abstract
Electro-optic modulators based on 25 monolayer langmuir-blodgett films of vinylidene fluoride and trifluoroethylene, P(VDF-TrFE), were fabricated. The LB films were prepared by transferring the monolayers on to an ITO coated glass with a surface pressure of 5 dyne/cm by use of the langmuir-schaefer deposition method. Measurement of the electro-optic coefficient has been carried out using a simple reflection techique. The E/O coefficient was found to be 154.9 pm/V and that value remained stable for at least 50 days.
File
References
- P. N. Prasad and D. J. Williams, Introduction to nonlinear optical effects in molecules and polymers (John Wiley & Sons, New York, 1991).
- R. W. Munn and C. N. Ironside, Principles and Applications of Nonlinear Optical Materials (Blackie Academic & Professional, London, 1993).
- Nanotechnology Polymer Optical Modulator (Winter Green Research Inc., Massachusetts, USA, 2005).
- K. D. Singer, J. E. Sohn, and S. J. Lalama, Appl. Phys. Lett. 49, 248 (1986). https://doi.org/10.1063/1.97184
- M. Eich, B. Reck, D. Y. Yoon, C. G. Willson, and G. C. Bjorklund, J. Appl. Phys. 66, 3241 (1989). https://doi.org/10.1063/1.344115
- D. Jungbauer, B. Reck, R. Twieg, D. Y. Yoon, C. G. Willson, and J. D. Swalen, Appl. Phys. Lett. 56, 2610 (1990). https://doi.org/10.1063/1.102853
- P. M. Ranon, Y. Shi, and W. H. Steier, Appl. Phys. Lett. 62, 2605 (1993). https://doi.org/10.1063/1.109285
- G. Roberts, Langmuir–Blodgett films (Plenum, New York, 1990).
- S. Ducharme, S. P. Palto, L. M. Blinov, and V. M. Fridkin, AIP Conf. Proc. 535, 354 (2000) https://doi.org/10.1063/1.1324474
- S. Ducharme, T. J. Reece, C. M. Othon, and R. K. Rannow, IEEE Trans. Device Mater Reliab. 5, 720 (2005). https://doi.org/10.1109/TDMR.2005.860818
- C. C. Teng and H. T. Man, Appl. Phys. Lett. 56, 1734 (1990). https://doi.org/10.1063/1.103107
- J. S. Lim, G. S. Park, and Y. S. Lee, Kor. J. Opt. and Photon. 12, 225 (2001).