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Structural and Dielectric Properties of Pb(zr0.2Ti0.8)O3 Thick Films Fabricated using a Screen Printing Technologies

  • Lee, Sung-Gap (Dept. of Ceramic Engineering, Gyeongsang National University) ;
  • Shim, Young-Jae (Dept. of Ceramic Engineering, Gyeongsang National University)
  • Published : 2005.06.01

Abstract

[ $Pb(Zr_{0.2}Ti_{0.8})O_3$ ] powders, prepared by the sol-gel method, were mixed with an organic vehicle and the PZT thick films were fabricated by the screen-printing techniques on Pt/alumina substrates. The structural and dielectric properties were examined as a function of sintering temperature. The particle size distribution of the powder is bimodal with the mean particle size of about $1.2\;{\mu}m$. The average grain size of the PZT thick films sintered above $1000^{\circ}C$ was about $3.1\;{\mu}m$ and the thickness of the specimens was approximately $41\;{\mu}m$. The relative dielectric constant and dielectric loss of the thick films sintered at $1050^{\circ}C$ were 337 and $1.24\%$, respectively.

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