# Structural and Dielectric Properties of Pb(zr0.2Ti0.8)O3 Thick Films Fabricated using a Screen Printing Technologies

• Lee, Sung-Gap (Dept. of Ceramic Engineering, Gyeongsang National University) ;
• Shim, Young-Jae (Dept. of Ceramic Engineering, Gyeongsang National University)
• Published : 2005.06.01

#### Abstract

[ $Pb(Zr_{0.2}Ti_{0.8})O_3$ ] powders, prepared by the sol-gel method, were mixed with an organic vehicle and the PZT thick films were fabricated by the screen-printing techniques on Pt/alumina substrates. The structural and dielectric properties were examined as a function of sintering temperature. The particle size distribution of the powder is bimodal with the mean particle size of about $1.2\;{\mu}m$. The average grain size of the PZT thick films sintered above $1000^{\circ}C$ was about $3.1\;{\mu}m$ and the thickness of the specimens was approximately $41\;{\mu}m$. The relative dielectric constant and dielectric loss of the thick films sintered at $1050^{\circ}C$ were 337 and $1.24\%$, respectively.

#### References

1. Y. H. Son, K. T. Kim, and C. I. Kim, 'Ferroelectric properties of Tb-doped PZT thin films prepared by sol-gel process', J. of KIEEME(in Korean), Vol. 17, No.9, p. 947, 2004
2. J. H. Park, 'Characterization of ferroelectric thin films in microwave region', J. of KIEEME(in Korean), Vol. 17, No.9, p. 947, 2004
3. B. H. Kim, J. H. An, K. S. Hwang, B. A. Kang, K. Nishio, and T. Tsuchiya, 'AFM analysis of chemical-solution-derived epitaxial PZT films prepared by using oxidizing or non-oxidizing pyrolysis', J. Korean Phys. Soc., Vol. 44, No.2, p. 346, 2004
4. Y. Ohba, M. Miyauchi, T. Tsurumi, and M. Daimon, 'Analysis of bending displacement of lead zirconate titanate thin film synthesized by hydrothermal method', Jpn. J. Appl. Phys., Vol. 32, No. 9B, p. 4095, 1993