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3D Vision Inspection Algorithm using Geometrical Pattern Matching Method

기하학적 패턴 매칭을 이용한 3차원 비전 검사 알고리즘

  • 정철진 (단국대학교 전자공학과) ;
  • 허경무 (단국대학교 전자공학과) ;
  • 김장기 (단국대학교 컴퓨터공학부)
  • Published : 2004.01.01

Abstract

We suggest a 3D vision inspection algorithm which is based on the external shape feature. Because many electronic parts have the regular shape, if we have the database of pattern and can recognize the object using the database of the object s pattern, we can inspect many types of electronic parts. Our proposed algorithm uses the geometrical pattern matching method and 3D database on the electronic parts. We applied our suggested algorithm fer inspecting several objects including typical IC and capacitor. Through the experiments, we could find that our suggested algorithm is more effective and more robust to the inspection environment(rotation angle, light source, etc.) than conventional 2D inspection methods. We also compared our suggested algorithm with the feature space trajectory method.

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