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The Thermal Stability of Teflon AF/FEP Double Layer Film Electret

Teflon AF/FEP 이중 필름 일렉트렛트의 열적 안정성

  • 김병수 (인하대학교 전기공학과) ;
  • 이덕출 (인하대학교 전기공학과)
  • Published : 2003.08.01

Abstract

To improve thermal stability of Teflon FEP which is the most widely used materials for electret application, Teflon AF film of 1 $\mu\textrm{m}$ thick was spin coated on FEP film and the charge storage properties were investigated. The surface potential depend on aging temperature. Thermal Stimulated Current(TSC), Atomic Force Microscopy(AFM), and Fourier Transform-Infrared Spectroscope(FT-lR) measurements were carried out. It is shown that the AF/FEP dual film have more higher electrical property and thermal stability than that FEP film have caused by charge stored at interface of AF and FEP.

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