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Characteristics of CMOS Transistor using Dual Poly-metal(W/WNx/Poly-Si) Gate Electrode

쌍극 폴리-금속 게이트를 적용한 CMOS 트랜지스터의 특성

  • 장성근 (청운대학교 전자공학과)
  • Published : 2002.03.01

Abstract

A giga-bit DRAM(dynamic random access memory) technology with W/WNx/poly-Si dual gate electrode is presented in 7his papers. We fabricated $0.16\mu\textrm{m}$ CMOS using this technology and succeeded in suppressing short-channel effects. The saturation current of nMOS and surface-channel pMOS(SC-pMOS) with a $0.16\mu\textrm{m}$ gate was observed 330 $\mu\A/\mu\textrm{m}$ and 100 $\mu\A/\mu\textrm{m}$ respectively. The lower salutation current of SC-pMOS is due to the p-doped poly gate depletion. SC-pMOS shows good DIBL(dram-induced harrier lowering) and sub-threshold characteristics, and there was no boron penetration.

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