Study on the Degradation Mechanism of FKM O-ring by X-ray Photoelectron Spectroscopy

X-ray Photoelectron Spectroscopy(XPS) 분석법을 이용한 FKM 오링의 노화 메카니즘 분석 연구

  • 이진혁 (한국신발피혁연구원 혁신소재연구단) ;
  • 배종우 (한국신발피혁연구원 혁신소재연구단) ;
  • 윤유미 (한국신발피혁연구원 혁신소재연구단) ;
  • 최명찬 (한국신발피혁연구원 혁신소재연구단) ;
  • 조남주 (부산대학교 고분자공학과)
  • Published : 2017.05.31

Abstract

In this study, we observed degradation mechanism of FKM O-ring by X-ray photoelectron spectroscopy(XPS) at atmosphere condition. FKM O-ring had 3.53mm of cross-sectional diameter and 91.67mm of inner diameter. After thermal degradation, oxygen atom concentration of FKM O-ring was increased to 20.39%, and fluorine atom concentration was decreased to 8.29%. We observed that degradation reaction occurred by oxidation reaction. By C1s and F1s peak analysis, we confirmed that oxidation reaction usually occurred at C-F bonding of FKM main chain. Also, carboxyl group(C-OH, C=O, O=C-O) produced by oxidation reaction from O1s peak analysis.

Acknowledgement

Grant : 실장착 오링 잔여노화수명평가

Supported by : 국과연